The premier European conference where scientists, engineers, researchers, and product developers gather to discuss the latest research in measurement systems, modeling, multimodal sensing, and inspection.
Optical Metrology will highlight new optical principles and systems for metrology, multimodal sensing, and machine vision with applications in industrial design, production engineering, process monitoring, maintenance support, biotechnology, vehicle navigation, multimedia technology, architecture, archaeology, and arts.
Special emphasis is directed to model-based, remote and active approaches, sensor fusion, robot guidance, image sequence processing and scene modelling, and biomaterials characterization, as well as to the preservation of our shared cultural heritage.
SPIE Optical Metrology features world-class plenary and keynote speakers:
Executive Director, R&D
Zygo Corporation, United States
Peter de Groot, PhD is the Executive Director of R&D at Zygo Corporation, a world leader in the design and manufacture of optics and metrology systems. In addition to 140 patents for optical measuring instruments and techniques, Peter has published 180 technical papers, tutorials, and book chapters in physics, education, optics and metrology. He is an honorary professor at the University of Nottingham, a Fellow and Director of the SPIE, an SPIE Kingslake award winner, and an active contributor in the optics community.
Optical instruments have long played a role in manufacturing, and strong arguments favor accelerated adoption of fast, non-contact measurements of surfaces, shapes and positions as an enabler for industry 4.0. High-precision techniques such as optical interferometry have advanced considerably and have found applications ranging from semiconductor wafer lithography to automotive engine production.
Even though there are clear benefits, there are obstacles to the more widespread adoption of optical techniques for dimensional measurements. Many of these obstacles are technical--such as vibration sensitivity and metrological traceability; but others reflect the cultural gaps between academia, makers of optical instruments, standards organizations and end users. In this talk, I propose that understanding these cultural differences can assist in advancing optical methods for the most critical needs of data-driven manufacturing.
23 June 2021 • 16:30 - 17:30 CEST
SPIE Optical Metrology Plenary
Optical sociology—How organizational culture impacts advances in optical metrology
Peter J. de Groot, Zygo Corporation, United States
SPIE Optical Metrology Keynotes
Shaping the future of biomedical imaging
Kishan Dholakia, University of St Andrews, United Kingdom
Detecting nanoscale perturbations using new forms of optical microscopy
Lynford L. Goddard, University of Illinois, United States
Stain-free 4D imaging of live sperm cells: the future of in-vitro fertilization
Natan Tzvi Shaked, Tel Aviv Univ., Israel
Seeing deep into engineered samples with dual-axis OCT
Adam P. Wax, Duke University, United States
Please see the conference tracks and sessions of the SPIE.Optical Metrolog below.
On-demand starting 21 June, 2021
The 2021 conference will be held in honor of Professor Fernando Puente León.
The complete conference program of SPIE Optical Metrology - sorted by conferences, presentation types and days – can be found here:
You would like to participate in Optical Metrology 2021?
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