Optical Metrology 2017
The premier European conference for the latest inventions and applications in the field of optical metrology.
Optical Metrology 2017 was organized by SPIE Europe Ltd
The Optical Metrology conference organized by SPIE Europe focused on the latest research in optical metrology, videometrics and machine vision with applications for solving measurement and inspection problems in industrial design and production engineering, vehicle navigation, multimedia technology, biotechnology, architecture, archaeology and arts.
Special emphasis is directed to model based, remote and active approaches, sensor fusion, robot guidance, image sequence processing, sensor fusion and scene modelling, characterization of biomaterials, as well as to the preservation of our shared cultural heritage.
Optical Metrology addresses attendees like engineers, scientists, researchers, trustees and managers.
Conference topicsConference topics
| • Optical Metrology in Industrial Design and Production Engineering |
| • Optical Instrumentation and Systems |
| • Software-Systems for Optical Metrology and Inspection |
| • Modelling Aspects in Optical Metrology |
| • High-Resolution Metrology |
| • Videometrics, Range Imaging and Applications |
| • 3D-Sensing and Visualization |
| • Autonomic Navigation |
| • Documentation, Preservation and Restoration of Art Work, Archaeological sites and Historical Buildings |
| • Inspection, Characterization and Imaging of Biomaterials and Tissues |
| • Multi-Modal Imaging and Inspection Technologies |
| • Material Recognition and Verification |
| • Defect Recognition and Verification |
| • Image Processing, Image Fusion and Image Modelling |
to top of pageSubconferences
| • Optical Measurement Systems for Industrial Inspection Chairs: Peter Lehmann (D), Wolfgang Osten (D), Armando Albertazzi (BR) |
| • Modeling Aspects in Optical Metrology Chairs: Frank Bodermann (D), K. Frenner (D), Ron Silver (US) |
| • Optics for Arts, Architecture, and Archaeology Chairs: Luca Pezzati (I), Piotr Targowski (PL), Vivi Tornari (GR) |
| • Videometrics, Range Imaging and Applications Chairs: Fabio Remondino (I), Mark R. Shortis (AUS) |
| • Automated Visual Inspection and Machine Vision Chairs: Jürgen Beyerer (D), Fernando Puente-Leon (D) |
| • Optical Methods for Inspection, Characterization and Imaging of Biomaterials Chairs: Pietro Ferraro (I), Monika Rich-Marte (AU) |
Plenary Speaker
| SPIE OPTICAL METROLOGY / DIGITAL OPTICAL TECHNOLGIES PLENARY SESSION Engineered Optical Functionalities through Flat Metasurfaces Prof. Federico Capasso, University of Harvard, Cambridge, MA, USA |
Chairmen
| Symposium Chairs Wolfgang Osten (Germany) |
About the organizers
| Organized by SPIE Europe |
| Sponsored by SPIE Europe and SPIE In cooperation with WLT |
Contact
| SPIE Europe Office 2 Alexandra Gate Ffordd Pengam, Cardiff, CF24 2SA Tel.: +44 29 2089-4747 Fax: +44 29 2089-4750 E-mail: info@spieeurope.org |
-
Your contact
- Ellen,
- Richter-Maierhofer
- Congress Manager
Messe München Homepage
Fair finder
